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TPXRD- 1000 Short Wavelength X-ray Diffractometer
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TPXRD- 1000 Short Wavelength X-ray Diffractometer

  • TPXRD- 1000
  • CHONGQING TOP
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Product Description

Application:

▇ Light alloy and its processing

▇ Structural strength of metal components

▇ Rolled steel sheet

▇ Ceramic materials and their processing

▇ Silicon material and its processing

▇ Archaeology and cultural relics identification

▇ Power plant

▇ And, determined by crystallographic diffraction analysis of the internal material, without destroying the sample or the workpiece.

 

 

 

Diffractometer

Material workpiece can measure maximum thickness:

70mm magnesium

40mm Aluminum

30mm silicon

8mm titanium

4mm iron

3.5mm nickel

3mm copper

Sample table workpiece maximum load bearing:20kg

Minimum diffraction volume:0.1mm ×0.4mm×1.0mm

The test error of Al(111) crystal plane spacing of aluminum powder standard is less than ±0.0006Å

Stress test error is less than ±25MPa

 

Remarks: The sample stage with a maximum load of 100kg can be designed according to user requirement


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