TPXRD- 1000 Short Wavelength X-ray Diffractometer

Application:

▇ Light alloy and its processing

▇ Structural strength of metal components

▇ Rolled steel sheet

▇ Ceramic materials and their processing

▇ Silicon material and its processing

▇ Archaeology and cultural relics identification

▇ Power plant

▇ And, determined by crystallographic diffraction analysis of the internal material, without destroying the sample or the workpiece.

Diffractometer

Material workpiece can measure maximum thickness：

70mm magnesium

40mm Aluminum

30mm silicon

8mm titanium

4mm iron

3.5mm nickel

3mm copper

Sample table workpiece maximum load bearing：20kg

Minimum diffraction volume：0.1mm ×0.4mm×1.0mm

The test error of Al(111) crystal plane spacing of aluminum powder standard is less than ±0.0006Å

Stress test error is less than ±25MPa

Remarks: The sample stage with a maximum load of 100kg can be designed according to user requirement